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業務聯絡窗口

  • 姓名: 林煜庭
  • Tel:+886-3-6669968
      Ext:1665
  • Fax:+886-3-6662955
  • Email:tim.lin@ytec.com.tw

Scud IC Test System

Scud IC Test System

Features Test Applications Electrical Specifications Benefits
  • Improved Productivity

    • Multi-Site (up to 8 sites), Parallel testing

    • Smallest Footprint

    • Standard Networking for automated data processing

  • Reduced Cost-Of-Test

    • Highest Performance/Cost Ratio for Consumer SoC (System-On-a-Chip) IC testing

    • Uses Standard AC Power : Reduce extra cost of facilities

  • Ease of Use

    • Fast Time to Market via Friendly Test Development Environment

    • Reduce Learning Curve

  • Full Function Test System

    • Flexible Configuration: Logic, Memory, Mixed-Signal and LCD Driver IC test options

    • Any Instrument in any Slot

    • Direct Mount Solution

 

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