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Equipment Capability
| Equipments | Vendor/Model | Capability |
|---|---|---|
| Tester | Credence SC Micro | 50MHz/256pins (Logic with APE IC Test System) |
| TESEC 941 TT/A | 1.5KV ,50A/3pins (MOSFET and BJT Discrete IC…etc) | |
| Scud-MOS (HV) | 32duts/ :+130V/50Ma, +10V/1.8A/ 24sets | |
| SPANIX SX - 1300 | Timing, DSP(*4) and C Bit64 Board (Linear IC Test System) | |
| Goblin | 5MHz/40pins (Logic IC Test System) | |
| G2000 Multi - site | 20MHz/256pins (Logic IC Test System) | |
| G3500 (SCUD) Multi -site | 20MHz/512pins (SoC & STN LCD Driver Test System) | |
| SCUD 1A (SCUD) Multi -site | 50MHz /256Pin/ MIX & OPM Board | |
| YT5100 5D (SCUD) Multi -site | 100MHz/512pins (SoC & STN LCD Driver Test System) | |
| YT5100 5C (SCUD) Multi -site | 100MHz/768pins (SoC & STN LCD Driver Test System) | |
| YT5100 2C (SCUD) Multi -site | 100MHz/768pins (SoC & STN LCD Driver Test System) | |
| YT5100 7D (SCUD) Multi -site | 100MHz/768pins (SoC & STN LCD Driver Test System) | |
| YOKOGAWA ST6730/ST6731 | 0.75GHz~3.5GHz/1344pins (SoC & STN LCD Driver Test System) | |
| Prober | TSK UF3000/Ex-e | 8”~12” Wafer |
| TSK UF2000 | 6”~8” Wafer | |
| TSK UF190A | 5”~8” Wafer | |
| TSK UF200/A | 5”~8” Wafer | |
| Handler | SJ - JS230 | SOP |
| SJ - JR/JT400 | DIP | |
| MT9308/9320 | SOP300MIL/SSOP28 | |
| YT6200/4SITE | Tape Reel TQFN/DFN 7*7、6*6、5*5、4*4、3*3、2.4*1.5 | |
| YT6300/4SITE | Tape Reel TQFN/DFN Light Sensor | |
| ISMECA/8SITE | Tape Reel TQFN /DFN 7*7、6*6、5*5、4*4、3*3、2.4*1.5 | |
| YT6110 /4SITE |
QFP : 44/L 、 80/L、 64/L、100/L 、 128/L、 160/L QFN，LGA，TQFP，BGA，LFBGA，UBGA，PGA，PLCC，SOP，TSOP，CSP |
|
| YT6120 /4SITE | ||
| YT6180/8SITE | ||
| SEIKO - EPSON NS - 8040 | ||
| Lead Scanner | ICOS CI-T120 | For LQFP/QFP/TSOP/TSSOP (Tray in/out only) |
| LASER | ESI9820 | For wafer laser 6"，8"，12"inch |